Overcoming nanoscale limits
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Category

NSG01




€ 300 
High Resolution NONCONTACT "GOLDEN" Silicon AFM Probes NSG01 series

 

NSG01 series specification

 

Material

Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped

Chip size

3.4x1.6x0.3mm

Reflective side

Au

Cantilever number

1 rectangular

Tip curvature radius

typical 6nm, guaranteed 10nm

Available coatings

conductive PtIr, TiN,Au;

magnetic CoCr

Available probe

bare, tipless, with Al reflective coating

 

 

 

   

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

NSG01

125

30

2.0

87

150

230

1.45

5.1

15.1